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ほとんど自分向けの外部記憶装置。

WD20EARSでsmartがバグる件

   

前回不良セクタを潰したWD20EARSですが,
また最近SMARTが報告してくるようになったんで,確認したらすごいことになっていました。

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   200   200   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0027   166   163   021    Pre-fail  Always       -       6683
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       130
  5 Reallocated_Sector_Ct   0x0033   199   199   140    Pre-fail  Always       -       2
  7 Seek_Error_Rate         0x002e   200   200   000    Old_age   Always       -       0
  9 Power_On_Hours          0x0032   063   063   000    Old_age   Always       -       27073
 10 Spin_Retry_Count        0x0032   100   100   000    Old_age   Always       -       0
 11 Calibration_Retry_Count 0x0032   100   100   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       114
192 Power-Off_Retract_Count 0x0032   200   200   000    Old_age   Always       -       49
193 Load_Cycle_Count        0x0032   001   001   000    Old_age   Always       -       2971032
194 Temperature_Celsius     0x0022   112   101   000    Old_age   Always       -       38
196 Reallocated_Event_Count 0x0032   199   199   000    Old_age   Always       -       1
197 Current_Pending_Sector  0x0032   001   001   000    Old_age   Always       -       65535
198 Offline_Uncorrectable   0x0030   200   200   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   200   192   000    Old_age   Always       -       54
200 Multi_Zone_Error_Rate   0x0008   200   200   000    Old_age   Offline      -       6

SMART Error Log Version: 1
ATA Error Count: 1
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 1 occurred at disk power-on lifetime: 26036 hours (1084 days + 20 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 70 79 5e e7  Error: UNC at LBA = 0x075e7970 = 123631984

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 00 20 79 5e e7 08  35d+23:45:43.947  READ DMA
  c8 00 00 20 78 5e e7 08  35d+23:45:43.947  READ DMA
  c8 00 00 20 77 5e e7 08  35d+23:45:43.946  READ DMA
  c8 00 00 20 76 5e e7 08  35d+23:45:43.945  READ DMA
  c8 00 00 20 75 5e e7 08  35d+23:45:43.944  READ DMA

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed without error       00%     26280         -
# 2  Short offline       Completed without error       00%     26274         -
# 3  Short offline       Completed without error       00%     26144         -
# 4  Short offline       Completed: read failure       90%     26144         123631985
# 5  Short offline       Completed: read failure       90%     26082         123631985
# 6  Extended offline    Completed without error       00%     15017         -
# 7  Extended offline    Completed: read failure       90%     15011         1443986379
3 of 3 failed self-tests are outdated by newer successful extended offline self-test # 1

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

 

セルフテストで”Completeed without error”なのに,何故かCurrent Pending Sectorが65535。。

( ゚д゚)ポカーン

意味わからん。。

負の方向に吹っ飛んでる気がした今日このごろでした。
これってファームのバグじゃねーの?

諦めて旧HGSTか元東芝のドライブでも入手するかなぁ。。
WDダメだ。。

 - linux