WD20EARSでsmartがバグる件
前回不良セクタを潰したWD20EARSですが，
また最近SMARTが報告してくるようになったんで，確認したらすごいことになっていました。
SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0027 166 163 021 Pre-fail Always - 6683 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 130 5 Reallocated_Sector_Ct 0x0033 199 199 140 Pre-fail Always - 2 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 063 063 000 Old_age Always - 27073 10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 114 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 49 193 Load_Cycle_Count 0x0032 001 001 000 Old_age Always - 2971032 194 Temperature_Celsius 0x0022 112 101 000 Old_age Always - 38 196 Reallocated_Event_Count 0x0032 199 199 000 Old_age Always - 1 197 Current_Pending_Sector 0x0032 001 001 000 Old_age Always - 65535 198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 192 000 Old_age Always - 54 200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 6 SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 occurred at disk power-on lifetime: 26036 hours (1084 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 70 79 5e e7 Error: UNC at LBA = 0x075e7970 = 123631984 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 00 20 79 5e e7 08 35d+23:45:43.947 READ DMA c8 00 00 20 78 5e e7 08 35d+23:45:43.947 READ DMA c8 00 00 20 77 5e e7 08 35d+23:45:43.946 READ DMA c8 00 00 20 76 5e e7 08 35d+23:45:43.945 READ DMA c8 00 00 20 75 5e e7 08 35d+23:45:43.944 READ DMA SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 26280 - # 2 Short offline Completed without error 00% 26274 - # 3 Short offline Completed without error 00% 26144 - # 4 Short offline Completed: read failure 90% 26144 123631985 # 5 Short offline Completed: read failure 90% 26082 123631985 # 6 Extended offline Completed without error 00% 15017 - # 7 Extended offline Completed: read failure 90% 15011 1443986379 3 of 3 failed self-tests are outdated by newer successful extended offline self-test # 1 SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
セルフテストで”Completeed without error”なのに，何故かCurrent Pending Sectorが65535。。
( ﾟдﾟ)ﾎﾟｶｰﾝ
意味わからん。。
負の方向に吹っ飛んでる気がした今日このごろでした。
これってファームのバグじゃねーの？
諦めて旧HGSTか元東芝のドライブでも入手するかなぁ。。
WDダメだ。。